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Semiconductor

首尔Engineering将会创造出无尽的挑战与革新的未来

제품소개
product name NSV 50/100/200
Detail

• NSV 100 : FOV = 100mm


• 表面检查: Orange feel and wheel mark of Bare boards(Glass, Crystal and Sapphire etc.)


• Bare board的 Vapor deposition 工程前检查


• 产品出库前或 AT时内部 defect(stria, growth strip) 检查


• 对于多种 film 种类非正规检查


• Wafer 表面检查 : crack, dimple and wheel mark etc.
 


 

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Saw marks (Polishing marks) :  有可能引发Crack的Saw mark

 


 

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Stria (inside defect) and Orange peel (surface defect) of Glass, Quartz, Crystal etc.
V-scope是可以检查肉眼无法确认 sample的内部 defect和 polishing mark的表面 defect.